Category Archives: Transistors

BS IEC 60747-7:2000 – Discrete semiconductor devices and integrated circuits. Bipolar transistors

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 124 pages, A4

Manufacturer – BSI

Price – GBP 196

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Keywords – Semiconductor devices, Integrated circuits, Electronic equipment and components, Bipolar transistors, Transistors, Low-voltage equipment, Signals, Power transistors, High-frequency amplifiers, Oscillators, Radio equipment, Switching circuits
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BS IEC 60747-7-5:2005 – Semiconductor devices. Discrete devices. Bipolar transistors for power switching applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 28 pages, A4

Manufacturer – BSI

Price – GBP 114

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductor devices, Integrated circuits, Electronic equipment and components, Optoelectronic devices, Bipolar transistors, Transistors, Switchgear, Switches, Ratings, Electrical measurement, Acceptance (approval), Reliability
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BS EN 62373:2006 – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 16 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Metal oxide semiconductors, Semiconductors, Transistors, Semiconductor devices, Electronic equipment and components, Voltage measurement, Testing conditions, Temperature
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BS IEC 60747-9:2007 – Semiconductor devices. Discrete devices. Insulated-gate bipolar transistors (IGBTs)

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 60 pages, A4

Manufacturer – BSI

Price – GBP 142

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductor devices, Integrated circuits, Electronic equipment and components, Bipolar transistors, Transistors, Electrical insulation, Symbols, Voltage, Electric current, Electrical properties and phenomena, Thermal resistance, Electrical resistance, Time, Ratings, Temperature, Rated voltage, Rated current, Rated power, Capacitance, Leakage currents, Response time, Electrical safety, Electrical measurement, Voltage measurement, Current measurement, Dissipation factor, Circuits, Testing condit
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BS IEC 60747-8-4:2004 – Discrete semiconductor devices. Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 64 pages, A4

Manufacturer – BSI

Price – GBP 160

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductor devices, Integrated circuits, Metal oxide semiconductors, Electronic equipment and components, Transistors
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08/30177349 DC – BS EN 62416. Hot carrier test on MOS transistors

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 9 pages, A4

Manufacturer – BSI

Price – GBP 20

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductors, Electrical conductivity, Electrical components, Electrical equipment, Electrical testing, Transistors
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BS 9364 N007 and N009:1978 – Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 10 pages, A4

Manufacturer – BSI

Price – GBP 40

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Ratings, Rated voltage, Rated current, Rated power, Working range, Temperature, Electric current, Voltage, Frequencies, Capacitance, Electrical properties and phenomena, Marking, Statistical quality control, Quality control, Testing condit
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BS 9364 N008 and N010:1978 – Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 2 pages, A4

Manufacturer – BSI

Price – GBP 30

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Rated voltage
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BS 9364 N011:1978 – Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 16 pages, A4

Manufacturer – BSI

Price – GBP 40

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Ratings, Rated voltage, Rated current, Rated power, Working range, Temperature, Electric current, Voltage, Frequencies, Capacitance, Electrical properties and phenomena, Marking, Statistical quality control, Quality control, Testing condit
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BS 9364 N012:1978 – Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 2 pages, A4

Manufacturer – BSI

Price – GBP 30

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Rated voltage
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BS 9364 N013:1979 – Detail specification for low power silicon p-n-p switching transistors. 25 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 10 pages, A4

Manufacturer – BSI

Price – GBP 40

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Ratings, Rated voltage, Rated current, Rated power, Working range, Temperature, Electric current, Voltage, Frequencies, Capacitance, Electrical properties and phenomena, Marking, Statistical quality control, Quality control, Testing condit
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BS 9364 N016:1979 – Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 10 pages, A4

Manufacturer – BSI

Price – GBP 40

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Ratings, Rated voltage, Rated current, Rated power, Working range, Temperature, Electric current, Voltage, Frequencies, Capacitance, Electrical properties and phenomena, Marking, Statistical quality control, Quality control, Testing condit
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BS 9364 N017:1979 – Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 4 pages, A4

Manufacturer – BSI

Price – GBP 30

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Rated voltage
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BS EN 150012:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 70 pages, A4

Manufacturer – BSI

Price – GBP 150

CLICK HERE FOR MORE INFORMATION

Keywords – Field-effect transistors, Transistors, Semiconductor devices, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions, Statistical quality control, Quality control, Amplifiers, Amplification, Low frequencies, High frequencies, Choppers (circuits), Switching circuits, Switches, Semiconductor resistors, Resistors, Direct current
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BS E9372:1976, CECC 50002:1976 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated bipolar transistors for low and high frequency amplification

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 14 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Amplification, Amplifiers, Electronic equipment and components, Low frequencies, High frequencies, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions, Statistical quality control, Quality control
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BS EN 150003:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 12 pages, A4

Manufacturer – BSI

Price – GBP 64

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Amplification, Amplifiers, Low frequencies, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions, Statistical quality control, Quality control
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BS EN 150004:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 16 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switches, Switching circuits, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions, Statistical quality control, Quality control
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BS EN 150007:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 26 pages, A4

Manufacturer – BSI

Price – GBP 114

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Amplification, Amplifiers, High frequencies, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions, Statistical quality control, Quality control
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BS EN 120003:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 22 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Electronic equipment and components, Quality assurance systems, Assessed quality, Phototransistors, Photoconducting devices, Multiple, Transistors, Semiconductor devices, Photoelectric devices, Optoelectronic devices, Detail specification, Specification (approval), Qualification approval, Approval testing, Inspection, Testing conditions, Statistical quality control, Quality control
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BS QC 750104:1991 – Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 18 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Switches, Transistors, Semiconductor devices, Electronic equipment and components, Detail specification, Quality assurance systems, Approval testing, Assessed quality
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BS QC 750107:1991 – Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 18 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, High-frequency amplifiers, Rated power, Cases, Semiconductor devices, Electronic equipment and components, Detail specification, Quality assurance systems, Approval testing, Assessed quality
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BS QC 750106:1993, IEC 60747-8-2:1993 – Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 36 pages, A4

Manufacturer – BSI

Price – GBP 114

CLICK HERE FOR MORE INFORMATION

Keywords – Electronic equipment and components, Quality assurance systems, Assessed quality, Approval testing, Detail specification, Semiconductor devices, Rated power, Transistors, Field-effect transistors, Power amplifiers, Inspection, Qualification approval
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BS EN 120004:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 26 pages, A4

Manufacturer – BSI

Price – GBP 114

CLICK HERE FOR MORE INFORMATION

Keywords – Phototransistors, Photoconducting devices, Semiconductor devices, Couplers, Electronic equipment and components, Optoelectronic devices, Photoelectric devices, Circuits, Quality assurance systems, Qualification approval, Approval testing, Specification (approval), Detail specification, Testing conditions, Inspection, Endurance testing, Quality control, Statistical quality control, Assessed quality, Electrical testing, Test equipment
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BS QC 750112:1988, IEC 60747-8-1:1987 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 20 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Quality assurance systems, Electronic equipment and components, Circuits, Semiconductor devices, Field-effect transistors, Unijunction transistors, Transistors, Assessed quality, Qualification approval, Approval testing, Inspection, Detail specification, Testing conditions, Performance, Electrical testing, Test equipment
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BS QC 750102:1990, IEC 60747-7-1:1989 – Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 32 pages, A4

Manufacturer – BSI

Price – GBP 114

CLICK HERE FOR MORE INFORMATION

Keywords – Electronic equipment and components, Detail specification, Semiconductor devices, Bipolar transistors, Assessed quality, Qualification approval, Quality assurance systems, Specification (approval), Inspection, Testing conditions, Approval testing, Transistors
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BS QC 750103:1990, IEC 60747-7-2:1989 – Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 14 pages, A4

Manufacturer – BSI

Price – GBP 40

CLICK HERE FOR MORE INFORMATION

Keywords – Electronic equipment and components, Semiconductor devices, Bipolar transistors, Low frequencies, Assessed quality, Qualification approval, Quality assurance systems, Specification (approval), Inspection, Testing conditions, Approval testing, Detail specification, Transistors
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BS QC 750114:1996, IEC 60747-8-3:1995 – Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 20 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductor devices, Electronic equipment and components, Field-effect transistors, Transistors, Quality assurance systems, Specification (approval), Detail specification, Assessed quality, Testing conditions, Inspection, Qualification approval, Approval testing
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BS IEC 60747-8:2000 – Discrete semiconductor devices and integrated circuits. Field-effect transistors. Additional ratings and characteristics and amds in the measuring methods for power switching field effect transistors.

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 72 pages, A4

Manufacturer – BSI

Price – GBP 170

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductor devices, Integrated circuits, Electronic equipment and components, Field-effect transistors, Transistors, Junction transistors, Electrical insulation
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BS IEC 60747-7:2000 – Discrete semiconductor devices and integrated circuits. Bipolar transistors

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 124 pages, A4

Manufacturer – BSI

Price – GBP 196

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductor devices, Integrated circuits, Electronic equipment and components, Bipolar transistors, Transistors, Low-voltage equipment, Signals, Power transistors, High-frequency amplifiers, Oscillators, Radio equipment, Switching circuits
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BS IEC 60747-7-5:2005 – Semiconductor devices. Discrete devices. Bipolar transistors for power switching applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 28 pages, A4

Manufacturer – BSI

Price – GBP 114

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductor devices, Integrated circuits, Electronic equipment and components, Optoelectronic devices, Bipolar transistors, Transistors, Switchgear, Switches, Ratings, Electrical measurement, Acceptance (approval), Reliability
|

BS EN 62373:2006 – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 16 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Metal oxide semiconductors, Semiconductors, Transistors, Semiconductor devices, Electronic equipment and components, Voltage measurement, Testing conditions, Temperature
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BS IEC 60747-9:2007 – Semiconductor devices. Discrete devices. Insulated-gate bipolar transistors (IGBTs)

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 60 pages, A4

Manufacturer – BSI

Price – GBP 142

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductor devices, Integrated circuits, Electronic equipment and components, Bipolar transistors, Transistors, Electrical insulation, Symbols, Voltage, Electric current, Electrical properties and phenomena, Thermal resistance, Electrical resistance, Time, Ratings, Temperature, Rated voltage, Rated current, Rated power, Capacitance, Leakage currents, Response time, Electrical safety, Electrical measurement, Voltage measurement, Current measurement, Dissipation factor, Circuits, Testing condit
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BS IEC 60747-8-4:2004 – Discrete semiconductor devices. Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 64 pages, A4

Manufacturer – BSI

Price – GBP 160

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductor devices, Integrated circuits, Metal oxide semiconductors, Electronic equipment and components, Transistors
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08/30177349 DC – BS EN 62416. Hot carrier test on MOS transistors

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 9 pages, A4

Manufacturer – BSI

Price – GBP 20

CLICK HERE FOR MORE INFORMATION

Keywords – Semiconductors, Electrical conductivity, Electrical components, Electrical equipment, Electrical testing, Transistors
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BS 9364 N007 and N009:1978 – Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 10 pages, A4

Manufacturer – BSI

Price – GBP 40

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Ratings, Rated voltage, Rated current, Rated power, Working range, Temperature, Electric current, Voltage, Frequencies, Capacitance, Electrical properties and phenomena, Marking, Statistical quality control, Quality control, Testing condit
|

BS 9364 N008 and N010:1978 – Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 2 pages, A4

Manufacturer – BSI

Price – GBP 30

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Rated voltage
|

BS 9364 N011:1978 – Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 16 pages, A4

Manufacturer – BSI

Price – GBP 40

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Ratings, Rated voltage, Rated current, Rated power, Working range, Temperature, Electric current, Voltage, Frequencies, Capacitance, Electrical properties and phenomena, Marking, Statistical quality control, Quality control, Testing condit
|

BS 9364 N012:1978 – Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 2 pages, A4

Manufacturer – BSI

Price – GBP 30

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Rated voltage
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BS 9364 N013:1979 – Detail specification for low power silicon p-n-p switching transistors. 25 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 10 pages, A4

Manufacturer – BSI

Price – GBP 40

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Ratings, Rated voltage, Rated current, Rated power, Working range, Temperature, Electric current, Voltage, Frequencies, Capacitance, Electrical properties and phenomena, Marking, Statistical quality control, Quality control, Testing condit
|

BS 9364 N016:1979 – Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 10 pages, A4

Manufacturer – BSI

Price – GBP 40

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Ratings, Rated voltage, Rated current, Rated power, Working range, Temperature, Electric current, Voltage, Frequencies, Capacitance, Electrical properties and phenomena, Marking, Statistical quality control, Quality control, Testing condit
|

BS 9364 N017:1979 – Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 4 pages, A4

Manufacturer – BSI

Price – GBP 30

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switching circuits, Switches, Epitaxial layers, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Design, Dimensions, Rated voltage
|

BS EN 150012:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 70 pages, A4

Manufacturer – BSI

Price – GBP 150

CLICK HERE FOR MORE INFORMATION

Keywords – Field-effect transistors, Transistors, Semiconductor devices, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions, Statistical quality control, Quality control, Amplifiers, Amplification, Low frequencies, High frequencies, Choppers (circuits), Switching circuits, Switches, Semiconductor resistors, Resistors, Direct current
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BS E9372:1976, CECC 50002:1976 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated bipolar transistors for low and high frequency amplification

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 14 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Amplification, Amplifiers, Electronic equipment and components, Low frequencies, High frequencies, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions, Statistical quality control, Quality control
|

BS EN 150003:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 12 pages, A4

Manufacturer – BSI

Price – GBP 64

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Amplification, Amplifiers, Low frequencies, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions, Statistical quality control, Quality control
|

BS EN 150004:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 16 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Switches, Switching circuits, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions, Statistical quality control, Quality control
|

BS EN 150007:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 26 pages, A4

Manufacturer – BSI

Price – GBP 114

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, Semiconductor devices, Amplification, Amplifiers, High frequencies, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Detail specification, Testing conditions, Statistical quality control, Quality control
|

BS EN 120003:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 22 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Electronic equipment and components, Quality assurance systems, Assessed quality, Phototransistors, Photoconducting devices, Multiple, Transistors, Semiconductor devices, Photoelectric devices, Optoelectronic devices, Detail specification, Specification (approval), Qualification approval, Approval testing, Inspection, Testing conditions, Statistical quality control, Quality control
|

BS QC 750104:1991 – Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 18 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Switches, Transistors, Semiconductor devices, Electronic equipment and components, Detail specification, Quality assurance systems, Approval testing, Assessed quality
|

BS QC 750107:1991 – Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 18 pages, A4

Manufacturer – BSI

Price – GBP 80

CLICK HERE FOR MORE INFORMATION

Keywords – Bipolar transistors, Transistors, High-frequency amplifiers, Rated power, Cases, Semiconductor devices, Electronic equipment and components, Detail specification, Quality assurance systems, Approval testing, Assessed quality
|

BS QC 750106:1993, IEC 60747-8-2:1993 – Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 36 pages, A4

Manufacturer – BSI

Price – GBP 114

CLICK HERE FOR MORE INFORMATION

Keywords – Electronic equipment and components, Quality assurance systems, Assessed quality, Approval testing, Detail specification, Semiconductor devices, Rated power, Transistors, Field-effect transistors, Power amplifiers, Inspection, Qualification approval
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BS EN 120004:1993 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 26 pages, A4

Manufacturer – BSI

Price – GBP 114

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Keywords – Phototransistors, Photoconducting devices, Semiconductor devices, Couplers, Electronic equipment and components, Optoelectronic devices, Photoelectric devices, Circuits, Quality assurance systems, Qualification approval, Approval testing, Specification (approval), Detail specification, Testing conditions, Inspection, Endurance testing, Quality control, Statistical quality control, Assessed quality, Electrical testing, Test equipment
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BS QC 750112:1988, IEC 60747-8-1:1987 – Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 20 pages, A4

Manufacturer – BSI

Price – GBP 80

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Keywords – Quality assurance systems, Electronic equipment and components, Circuits, Semiconductor devices, Field-effect transistors, Unijunction transistors, Transistors, Assessed quality, Qualification approval, Approval testing, Inspection, Detail specification, Testing conditions, Performance, Electrical testing, Test equipment
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BS QC 750102:1990, IEC 60747-7-1:1989 – Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 32 pages, A4

Manufacturer – BSI

Price – GBP 114

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Keywords – Electronic equipment and components, Detail specification, Semiconductor devices, Bipolar transistors, Assessed quality, Qualification approval, Quality assurance systems, Specification (approval), Inspection, Testing conditions, Approval testing, Transistors
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BS QC 750103:1990, IEC 60747-7-2:1989 – Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 14 pages, A4

Manufacturer – BSI

Price – GBP 40

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Keywords – Electronic equipment and components, Semiconductor devices, Bipolar transistors, Low frequencies, Assessed quality, Qualification approval, Quality assurance systems, Specification (approval), Inspection, Testing conditions, Approval testing, Detail specification, Transistors
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BS QC 750114:1996, IEC 60747-8-3:1995 – Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 20 pages, A4

Manufacturer – BSI

Price – GBP 80

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Keywords – Semiconductor devices, Electronic equipment and components, Field-effect transistors, Transistors, Quality assurance systems, Specification (approval), Detail specification, Assessed quality, Testing conditions, Inspection, Qualification approval, Approval testing
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BS IEC 60747-8:2000 – Discrete semiconductor devices and integrated circuits. Field-effect transistors. Additional ratings and characteristics and amds in the measuring methods for power switching field effect transistors.

Available as PDF document for immediate download, or as printed publication – yes

Number of pages – 72 pages, A4

Manufacturer – BSI

Price – GBP 170

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Keywords – Semiconductor devices, Integrated circuits, Electronic equipment and components, Field-effect transistors, Transistors, Junction transistors, Electrical insulation
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